The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2000
Filed:
Jan. 26, 1998
Don Coppersmith, Ossining, NY (US);
Se June Hong, Yorktown Heights, NY (US);
Jonathan R Hosking, Scarsdale, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A fast way for determining the best subset test for a nominal attribute in a decision tree. When a nominal attribute has n distinct values, the prior art requires computing the impurity functions on each of the 2.sup.n-1 -1 possible subset partitioning of the n values and finding the minimum case among them. This invention guarantees the minimum impurity test on the attribute by computing only (n-1) impurity function computations. This reduction of computational complexity makes it practically possible to find the true best tests for many real data mining application, where a binary decision tree is used as the classification model.