The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2000
Filed:
Nov. 18, 1997
Applicant:
Inventor:
Koji Urasawa, Tokyo, JP;
Assignee:
Oki Data Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358456 ; 358457 ; 358534 ; 358535 ; 358536 ; 358298 ;
Abstract
Dither patterns are generated for use in converting a gray-scale image to a bi-level image. The dither patterns simulate halftone screen patterns with arbitrary screen angles. The dither patterns are made up of unit patterns, and have sizes calculated so that the unit patterns match up at the edges of the dither pattern.