The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2000
Filed:
Jun. 11, 1999
Fang Chen, Rochester Hills, MI (US);
Mumin Song, Ann Arbor, MI (US);
Patrick J Harwood, Farmington Hills, MI (US);
Christopher Thomas Griffen, Trenton, MI (US);
Other;
Abstract
A measurement system (10) for accurately measuring the surface geometry of a part in three dimensions includes a laser (22) for emitting a laser beam (20). An objective lens (18) receives the laser beam (20) and expands the received laser beam (20) into a diverged beam. A liquid crystal system (16) is disposed in front of the objective lens (18) with respect to the laser (22) for receiving the diverged beam. The liquid crystal system (16) receives the diverged beam and generates at least one fringe pattern (24) on a surface of a three dimensional part which is to be measured. A computer (12) is in communication with the liquid crystal system (16) to control the pitch and phase of the fringe pattern (24).