The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2000

Filed:

Sep. 17, 1998
Applicant:
Inventor:

Mujibun Nisa Khan, Holmdel, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
356 731 ; 385 49 ; 385 50 ;
Abstract

A method for determining waveguide facet reflectivity from the electric field propagated from an optical fiber into an optical waveguide. The method determines the electric field propagated from the optical fiber into the optical waveguide by combining field terms resulting from multiple reflections occurring at an endface of the optical fiber and an input facet of the optical waveguide; determines the amount of optical field transmitted into the waveguide as a function of gap distance between the optical fiber and the waveguide; determines the optical power transmitted into the waveguide from the amount of field transmitted into the waveguide; and determines the waveguide facet reflectivity from the determined amount of optical power transmitted into the waveguide.


Find Patent Forward Citations

Khan, Mujibun. (2000). Method for determining waveguide facet reflectivity (U.S. Patent No. 6100968). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6100968

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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