The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2000
Filed:
Sep. 25, 1997
Tomoaki Kato, Tokyo, JP;
Yoshio Takada, Tokyo, JP;
Kei-ichiro Kobayashi, Tokyo, JP;
Akio Hori, Tokyo, JP;
Osamu Wada, Tokyo, JP;
Masahiro Kobayashi, Tokyo, JP;
Naomi Furuse, Tokyo, JP;
Shinji Ishibe, Tokyo, JP;
Mitsunori Hama, Tokyo, JP;
Shoichi Shichimiya, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A voltage nonlinear resistor of a sintered substance of a composite consisting essentially of zinc oxide and containing at least one rare earth element and at least one additional rare earth element selected from the group consisting of Eu, Gd, Tb, Dy, Ho, Y, Er, Tm, Yb, and Lu, and Bi and Sb. Spacing d.sub.n (.ANG.) provided from precipitation grains formed in zinc oxide grains or on a grain boundary lies in the range of 2.85 .ANG..ltoreq.d.sub.1 .ltoreq.2.91 .ANG., 1.83 .ANG..ltoreq.d.sub.2 .ltoreq.1.89 .ANG., 1.77 .ANG..ltoreq.d.sub.3 .ltoreq.1.82 .ANG., 1.56 .ANG..ltoreq.d.sub.4 .ltoreq.1.61 .ANG., 1.54 .ANG..ltoreq.d.sub.5 .ltoreq.1.60 .ANG.. The spacing mentioned here is a spacing obtained according to the Bragg condition in the X-ray diffraction method.