The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2000

Filed:

Jun. 16, 1998
Applicant:
Inventor:

Bun Mizuhara, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
711108 ; 712300 ;
Abstract

In a longest coincidence data detecting apparatus, a control section distributes an external data to the N M-bit associative memory units to satisfy a relation of X.sub.ij =Y.sub.Nj+i where each of N and M is an integer more than 1, 0.ltoreq.i<N, 0.ltoreq.j<M, i and j are integers, X.sub.ij is a j-th bit of the i-th one of the N associative memory units, and Y.sub.k is a k-th bit of the external data. Each of the N associative memory units compares a distributed portion of the external data and a corresponding portion of an internal data in a designated bit region from a most significant bit of the distributed portion, and outputs a matching signal when the distributed portion of the external data portion and the corresponding portion of the internal data are coincident with each other in the designated bit region.


Find Patent Forward Citations

Mizuhara, Bun. (2000). Longest coincidence data detection using associative memory units having (U.S. Patent No. 6098147). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6098147

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