The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2000

Filed:

Sep. 30, 1998
Applicant:
Inventor:

Heang K Tuy, Chesterland, OH (US);

Assignee:

Picker International, Inc., Highland Heights, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
378-4 ; 378 15 ; 378901 ;
Abstract

A method of image reconstruction from partial cone beam data includes collecting the partial cone beam data in two-dimensional arrays. The collected data corresponds to rays of radiation diverging in two dimensions from a common vertex as the vertex travels along a curve. Each element of the data represents a line integral of an object being reconstructed taken along each ray. The data is then pre-weighted and a local coordinate system is defined. A one-dimensional convolution of the pre-weighted data is computed in the local coordinate system along a direction which is tangential to the curve along which the vertex travels. Finally, the convolved data is weighted and three-dimensionally backprojected. In a preferred embodiment, the curve defines a helical path, and the kernel for the one-dimensional convolution of the pre-weighted data is a ramp convolver.


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