The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2000
Filed:
Feb. 02, 1999
Akira Watanabe, Hanno, JP;
Shunichi Kubota, Hino, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
An observation lens barrel for use in a microscope, comprising a main body for receiving a light beam applied from the microscope and including an image to be observed, an observation optical system provided in the main body and extending at right angles to a direction in which the light beam from the microscope is focused, and optical elements provided in the main body, for receiving the light beam from the microscope and emitting a light beam to the observation optical system. The main body has a first port and a second port. The first port is provided on a side opposing the microscope, with the optical elements located between the first port and the microscope. The second port is provided on a side opposing the observation optical system, with the optical elements located between the second port and the observation optical system. The optical elements include an optical element which guides at least the light beam applied from the microscope, to the first port, and which guides, to the observation optical system, a light beam applied from the second port, which crosses the light beam guided to the first port.