The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2000
Filed:
Jun. 02, 1999
Satoru Satake, Tokyo, JP;
Yasuharu Mitoma, Hiroshima, JP;
Satake Corporation, Tokyo, JP;
Abstract
A granular object evaluation device for evaluating quality and shapes of transparent or translucent granular objects includes an illuminating device for irradiating light to the object fed into a measuring area by a feeder, a detecting device in which a detection viewing line is directed to the measuring area through a center portion of the illuminating device and which receives reflection light from the object, a light shielding plate located between the illuminating device and the detecting device, for preventing the light from the illuminating device from directly incident on the detecting device, and having an opening through which the detection viewing line passes, and a control device for analyzing detected signals from the detecting device and evaluating quality and shapes of the granular object. The device further includes a shielding mask for shielding light from a predetermined area such that no irradiation is made directly on the granular object from the predetermined area of the illuminating device with the detection viewing line as the center. Evaluation of quality of the granular object can be effected without being influenced by the reflection light which affects in the evaluation of the quality as an obstacle.