The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2000

Filed:

Jun. 08, 1999
Applicant:
Inventors:

Barry Scott Smith, Hopewell, VA (US);

Michael J Mullins, Chesterfield, VA (US);

Roy E Van Derlinden, Frederick, MD (US);

Donald L Irvin, Leesburg, VA (US);

Assignee:

Philip Morris Incorporated, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
3562371 ; 3562373 ; 3562391 ; 2502 / ;
Abstract

An apparatus for the detection of surface flaws in material having a surface which is partially reflective includes at least one light source arranged to direct incident light on a surface of an at least partially reflective material, and a light detector disposed above the surface of the material. The light detector and the at least one light source are arranged relative to each other such that, in the absence of a surface flaw in the material, substantially no light from the at least one light source is detected by the light detector and, in the presence of a surface flaw in the material, light from the at least one light source is reflected off of the flaw and into the detector.


Find Patent Forward Citations

Loading…