The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2000
Filed:
Jul. 02, 1998
Robert T Frankot, Tucson, AZ (US);
Raytheon Company, Lexington, MA (US);
Abstract
A family of multiple scale adaptive filters and filtering methods that automatically adapt their impulse response width to local data characteristics, optimizing the accuracy, yield, and/or detail of interferometric measurements. A prefilter with fixed impulse response width is applied to a complex interferogram. The phase of the prefiltered complex interferogram is unwrapped. Then, a weighted combination of the phase-unwrapped, fixed-filtered interferograms is computed using a data-dependent criterion function. The resulting weighting function at each resolution element is typically a nonlinear function of interferogram magnitude and coherence for each fixed filter output at that resolution element.