The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2000
Filed:
Jun. 29, 1999
Toshihiko Kozima, Toyonaka, JP;
Norio Nakata, Yoyonaka, JP;
Hiromichi Kurata, Yoyonaka, JP;
Takayoshi Masaoka, Yoyonaka, JP;
Abstract
Provided is a faulty sewing detector that is, for example, mounted on an overlock sewing machine, with which an over-edge chain stitch is made in a state in which a body fabric and a sleeve fabric of a T shirt or underwear are overlapped with each other. The detector comprises a fabric twisting detecting sensor that detects a fabric twisting by determining the number of overlap of fabrics sewed which is disposed at a position corresponding to the fabric sewing area of a needle, and, behind a needle location in a sewing direction; a faulty sewing judging means that compares a fabric twisting quantity detected by the sensor, with a preset permissible fabric twisting quantity, to judge it as faulty sewing when the former exceeds the latter; and an informing means that is activated when judged as faulty sewing. With this construction, a faulty sewing due to slip out even in performing a curve stitch can be detected reliably, and a variety of attachments, as required, can be mounted freely in front of the needle location.