The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2000
Filed:
Aug. 22, 1997
Rakesh Agrawal, San Jose, CA (US);
Sunita Sarawagi, San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for locating data anomalies in a k dimensional data cube that includes the steps of associating a surprise value with each cell of a data cube, and indicating a data anomaly when the surprise value associated with a cell exceeds a predetermined exception threshold. According to one aspect of the invention, the surprise value associated with each cell is a composite value that is based on at least one of a Self-Exp value for the cell, an In-Exp value for the cell and a Path-Exp value for the cell. Preferably, the step of associating the surprise value with each cell includes the steps of determining a Self-Exp value for the cell, determining an In-Exp value for the cell, determining a Path-Exp value for the cell, and then generating the surprise value for the cell based on the Self-Exp value, the In-Exp value and the Path-value.