The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2000
Filed:
Mar. 27, 1998
Samsung Electronics Co., Ltd., Suwon, KR;
Abstract
The present invention is a method and apparatus for removing transient DC level shifts caused by thermal asperities. A read signal is generated by a transducer in response to proximate contact between the transducer and magnetic flux fields recorded on a magnetic media surface. The read signal is provided to a continuous time filter and a sampler. During normal operation, the output of the sampler is provided directly to a fixed delay tree search detector. Upon encountering a thermal asperity, the output of the sampler is first provided to a 1-D sampled filter which removes the DC shift caused by the thermal asperity and then to the fixed delay tree search detector, which provides signal recovery. A multiplexer provides selection of the output signal from between sampler and the 1-D sample filter.