The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2000
Filed:
Nov. 18, 1997
Applicant:
Inventors:
Shingo Kashima, Sagamihara, JP;
Yosuke Kishi, Yokohama, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ; G01J / ;
U.S. Cl.
CPC ...
359385 ; 359368 ; 359389 ; 359204 ; 356317 ; 356318 ;
Abstract
A laser scanning microscope having a first scanning optical system that causes coherent light projected from a first laser light source to scan a specimen, and a second scanning optical system that projects coherent light output from a second laser light source at a given position on the specimen. Fluorescence from the specimen is measured by a photoelectric conversion element.
Kashima, Shingo. (2000). Laser scanning microscope (U.S. Patent No. 6094300). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6094300
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile