The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2000
Filed:
Aug. 12, 1998
Todd J Rockstroh, Maineville, OH (US);
Wilbur D Scheidt, Cincinnati, OH (US);
General Electric Company, Cincinnati, OH (US);
Abstract
A method for quality assurance of a laser shock peening process uses interferometry to form a fringe image from first and second interferograms of unstressed and stressed laser shock peened patches respectively of a workpiece. The fringe image may then be compared to a predetermined correlation of fringe images for indicating quality assurance. Stressing the laser shock peened patch may include loading the production and test workpieces during the production of the first and second images by interferometry while the production and test workpieces are fixtured. The loading may be done by heating, twisting, or bending of at least a portion of the production and test workpieces. The comparing of the production images of fringes may include comparing fringe characteristics of the laser shock peened patches on the production workpieces laser against fringe characteristics of the predetermined correlation.