The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2000
Filed:
Aug. 25, 1998
Applicant:
Inventors:
Toshihiro Takahashi, Osaka, JP;
Yasutaka Tsukamoto, Hyogo, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
703 14 ; 703 19 ; 714 25 ; 714726 ; 714741 ;
Abstract
Operation cycles to be subjected to an IDDQ test are selected from among operation cycles defined by a test pattern for a functional test of a CMOS integrated circuit so that a sufficient and necessary number of operation cycles are accurately and rapidly selected. A combination of sets of m-bit data are selected so that the combination includes sets of m-bit data each bit of which is changed from one of the values '0' and '1' to the other at least once. The operation cycles corresponding to the sets of m-bit data included in the combination are rendered to be the IDDQ test cycles to be subjected to the IDDQ test.