The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2000

Filed:

Aug. 04, 1998
Applicant:
Inventor:

David N Levin, Chicago, IL (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600558 ;
Abstract

A method for measuring perception of an observer comprises a) selecting a first, second, and third stimulus and presenting the stimuli to the observer; b) determining observer-defined fourth stimulus such that the observer perceives the fourth stimulus to be related to the third stimulus in the same way as the observer perceives the second stimulus to be related to the first stimulus; c) selecting a new first, second, and third stimulus, at least one of the new stimuli corresponding to a stimulus point that is different from the stimulus points corresponding to the previously selected stimulus; d) determining a new observer-defined fourth stimulus such that the observer perceives the new fourth stimulus to be related to the new third stimulus in the same way as the observer perceives the new second stimulus to be related to the new first stimulus; and e) performing steps (c) through (d) until a predetermined number of sets of four stimuli are determined.


Find Patent Forward Citations

Levin, David. (2000). Method and apparatus for measurement, analysis, characterization, (U.S. Patent No. 6093153). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6093153

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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