The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2000

Filed:

Nov. 12, 1998
Applicant:
Inventors:

Rodney A Mattson, Mentor, OH (US);

Pieter G Roos, Bainbridge, OH (US);

Assignee:

Picker International, Inc., Highland Heights, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
378205 ; 378 982 ; 378197 ; 378207 ;
Abstract

An x-ray source (30) transmits a beam of x-rays through an examination region (E). A detector (28), in an initial spatial orientation relative to the source, receives the beam and generates a view of image data indicative of the intensity of the beam received. A first accelerometer (40), capable of generating acceleration data in at least one dimension, is associated with the detector. A second accelerometer (42), capable of generating acceleration data in at least one dimension is associated with the source. A position calculator (60) mathematically calculates a position of both the source and detector based on the acceleration data generated by the accelerometers. An image reconstructor (62) receives the relative position data; electronically corrects for any misalignment or change in beam travel distance, and reconstructs the views into a volumetric image representation.


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