The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2000

Filed:

Aug. 05, 1997
Applicant:
Inventor:

Tadashi Sakamoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36472502 ;
Abstract

When a two-dimensional DCT is divided into first and second one-dimensional DCTs, a plurality of intermediate results obtained by the first one-dimensional DCT can be read out at a time. Intermediate results .phi.(x, v) are arranged in a new matrix M1 along columns, not rearranged in the same matrix in place of pixel values f(x, y), so that the intermediate results .phi.(x, v) can be read out along rows in the second one-dimensional DCT. That is, the intermediate results can be read out consecutively, or all together if the width of processable bits in hardware or software which performs the DCT is large enough. Further, when u=v, necessary data for process is located in the same row both in the matrices M1 and M2, which enables consecutive readout of the data.


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