The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2000
Filed:
Aug. 28, 1998
Applicant:
Inventors:
Yoseph Bar-Cohen, Seal Beach, CA (US);
Shyh-Shiuh Lih, Chatsworth, CA (US);
Assignee:
California Institute of Technology, Pasadena, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73624 ; 73621 ; 73627 ;
Abstract
A system which rapidly determines the elastic stiffness constants of materials in plate shape as well as characterize material flaws that are affecting these constants. Rapid (below a minute) nondestructive evaluation system allow for the determination of material stiffness constants, low noise data acquisition algorithm for measuring spectral data. A real time method of displaying leaky Lamb wave spectral data.
Bar-Cohen, Yoseph. (2000). Ultrasonic system for automatic determination of material stiffness (U.S. Patent No. 6092421). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6092421
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile