The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2000
Filed:
Nov. 03, 1997
Nobuyasu Kanekawa, Hitachi, JP;
Shoji Suzuki, Hitachi, JP;
Yoshimichi Sato, Hitachi, JP;
Korefumi Tashiro, Hitachi, JP;
Keisuke Bekki, Hitachi, JP;
Hiroshi Sato, Katsuta, JP;
Makoto Nohmi, Katsuta, JP;
Shinya Ohtsuji, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A self-checking circuit, which is useful for a highly reliable system configuration, includes a logic circuit having an error detection function. For function blocks for feeding out a plurality of signals that are at least duplexed, the logic circuit compares the output signals of the function blocks, and detects an error on the basis of results of the comparison. The logic circuit comprises synthesizing means provided to superimpose inherent waveforms assigned in advance to the respective output signals of the function blocks onto the output signals of one of the function blocks. The inherent waveforms are orthogonal waveforms generated by an orthogonal waveform generator circuit. The logic circuit also comprises comparison means for comparing a signal output of the synthesizing means with the signal output of the other function block to detect an error. The whole circuit including the function blocks are judged normal only if the waveforms inherent to both output signals exist.