The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2000

Filed:

Oct. 14, 1997
Applicant:
Inventors:

Scott Lee Kastman, Greenville, WI (US);

Robert Griffiths Brandon, Appleton, WI (US);

Louis Maurice Chapdelaine, Appleton, WI (US);

Joseph Daniel Coenen, Neenah, WI (US);

Robert Lee Popp, Hortonville, WI (US);

Devertt DeWayne Woolwine, Neenah, WI (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; B23B / ;
U.S. Cl.
CPC ...
700118 ; 700131 ; 700125 ; 156229 ;
Abstract

A process and apparatus for controllably registering two continuously moving layers of material is provided. A continuously moving first layer has a plurality of components, and a continuously moving second layer has a plurality of reference marks representing a respective plurality of components. The process and apparatus control the distance between reference marks of the second layer to a selected distance, and then controllably registers each reference mark of the second layer to a respective component of the continuously moving first layer.


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