The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2000

Filed:

Oct. 10, 1997
Applicant:
Inventors:

Lev T Perelman, Malden, MA (US);

Vadim Backman, Cambridge, MA (US);

Michael S Feld, Newton, MA (US);

George Zonios, Cambridge, MA (US);

Irving Itzkan, Boston, MA (US);

Ramasamy Manoharan, Wooster, OH (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600476 ;
Abstract

The present invention relates to systems and methods for measuring one or more physical characteristics of material such as tissue using optical radiation. The system can use light that is scattered by a tissue layer to determine, for example, the size of nuclei in the tissue layer to aid in the characterization of the tissue. These methods can include the use of fiber optic devices to deliver and collect light from a tissue region of interest to diagnose, for example, whether the tissue is normal or precancerous.


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