The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2000

Filed:

Oct. 10, 1997
Applicant:
Inventors:

David A Schafer, Natick, MA (US);

Simon George Harootian, Worcester, MA (US);

Sorin Marcovici, Lexington, MA (US);

Assignee:

Analogic Corporation, Peabody, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 19 ; 25037011 ;
Abstract

A two-dimensional area detector array for a CT scanning system includes a set of alignment grids for aligning individual scintillator crystals with corresponding photodiodes and for preventing optical and electrical interference between adjacent photodiodes. The alignment grids thus facilitate efficient transfer of information from the scintillation crystals to the photodiodes and also permit the detector array to be constructed with many very small, very closely spaced individual detector elements. The alignment grids are preferably made of a substantially opaque material having a relatively low coefficient of thermal expansion. They provide a highly beneficial dimensional stability to the detector array under the typical operating conditions of the CT scanner.


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