The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2000
Filed:
Jul. 01, 1998
Robert Mark Gorday, West Palm Beach, FL (US);
Gregory O Snowden, Boca Raton, FL (US);
Craig Christmas, West Palm Beach, FL (US);
Stuart Kreitzer, Coral Springs, FL (US);
Kenneth C Elkin, Lake Worth, FL (US);
Leonard Bennett, Plantation, FL (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
A method of producing a receive signal quality estimate in a subscriber unit (SU) located in a given geographic area covered by a wireless communication system of a kind in which a base station transmits downlink signals in a group of successive time frames directed to a set of geographic areas including an area in which the SU is located, wherein each of the group of successive time frames has signals aimed at a corresponding one of the set of geographic areas. The method comprises the steps of activating a receiver in the SU to listen over a determined listening interval that at least partly coincides with the group of successive time frames; measuring a signal strength of at least one downlink signal received by the SU receiver during the determined listening interval within one of, a time frame of the group of successive time frames corresponding to a geographic area in which the SU is located, and one other time frame of the group of successive time frames corresponding to a geographic area other than the geographic area in which the SU is located; and producing an estimate of receive signal quality at the SU according to a result of the measuring step.