The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2000
Filed:
Sep. 25, 1996
Michael L Strickland, Marietta, GA (US);
James P Olivier, Lawrenceville, GA (US);
William B Conklin, Lawrenceville, GA (US);
Warren P Hendrix, Lawrenceville, GA (US);
Micromeritics Instrument Corporation, Norcross, GA (US);
Abstract
An apparatus and method are disclosed for obtaining and analyzing light scattering data to determine the size distribution of a group of dispersed particles that scattered the light. The apparatus and method use a two-dimensional array of photosensitive pixels such as a charge-coupled device (CCD) or an array of solid-state photodiodes. The analyzer illuminates the particles with a dose of light in a collimated beam from a light source so as to scatter light of the beam, and at least a portion of the light interacting with the particles is detected with the photosensitive pixel array. The pixels are functionally equivalent and the analyzer dynamically configures and re-configures at least a portion of the pixels into a variable number of data collection areas which correspond to a selected set of scattering angles. The analyzer also determines whether and, from the pixel output data, where an unscattered center of the incident light beam intersects the pixel array. Thus, no precision mechanical alignment of the light source and the pixel array detector is required prior to operation of the analyzer. Furthermore, the ability of the analyzer to determine the unscattered beam center allows the analyzer to classify each of at least a portion of the pixels to data collection areas according to a function of the geometric relationship the pixel bears to the location of the beam center.