The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2000

Filed:

Dec. 08, 1997
Applicant:
Inventors:

Junji Horikawa, Tokyo, JP;

Takashi Totsuka, Chiba, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T / ;
U.S. Cl.
CPC ...
345419 ;
Abstract

A method and apparatus for approximating shape data in which the degree of fineness of a desired portion is set so as to differ from that of other portions for hierarchical approximation by a facilitated designating operation. Polygon data of an original are entered and the partial degree of fineness of the polygon model is designated by the user. It is designated to which degree the model is approximated and each edge is evaluated for removing edges. The evaluated values are sorted in accordance with the magnitudes of the evaluated values and controlled responsive to designation by the user of the partial degree of approximation. An edge with the least evaluated value is selected and removed and the position of the apex points left after removing the edge are determined to see whether or not approximation has reached a desired degree of approximation. An approximated model is selected from plural hierarchies and processed for drawing or saving.


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