The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2000

Filed:

Sep. 18, 1998
Applicant:
Inventors:

John M Butler, Menlo Park, CA (US);

Jia Li, Union City, CA (US);

Joseph A Monforte, Berkeley, CA (US);

Christopher H Becker, Palo Alto, CA (US);

Assignee:

Genetrace Systems, Inc., Alameda, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07H / ; C12P / ; C12Q / ;
U.S. Cl.
CPC ...
435-6 ; 435 912 ; 435 915 ; 436173 ; 935-8 ; 935 17 ; 935 77 ; 935 78 ;
Abstract

The present invention is related to the fields of genetic mapping and genetic identity detection, including forensic identification and paternity testing. This invention is more specifically directed to the use of mass spectrometry to detect length variation in DNA nucleotide sequence repeats (including variants of common alleles), such as microsatellites and short tandem repeats, and to DNA sequences provided as primers for the analysis of DNA tandem nucleotide repeat polymorphisms at specific loci on specific chromosomes.


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