The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2000

Filed:

Feb. 17, 1999
Applicant:
Inventors:

Henrietta L Galiana, St. Lambert, CA;

Heather L Smith, Montreal West, CA;

Assignee:

McGill University, Montreal, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351202 ;
Abstract

For segmenting a sampled signal having at least two temporally separate interleaved dominant components for the purposes of extracting one or more of the separate components, an automated method of analyzing the sampled signal is used. By selecting a model for the signal and a processing window dimension, a variance between the signal and a model value for the signal is measured within the window over the sampled domain to obtain a noise indicator value. A corner geometry value for the sampled signal is calculated within the same window over the domain. A transition indicator value is generated based on a ratio of the corner geometry value and the model value. The segmentation points are identified based on the transition indicator value and at least one of the noise indicator value and the model value within the window over the domain.


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