The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2000
Filed:
Jun. 12, 1998
Hajime Hiroi, Tokyo, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
There is provided a cooling system of a semiconductor testing device wherein the number of revolutions of a fan is controlled so as to obtain proper air-flow corresponding to a heating value for every operating mode of the measuring unit, thereby preventing power from being wasted. The cooling system of a semiconductor testing device comprises a fan for cooling the measuring unit by the rotation of a DC motor, a temperature sensor for measuring a temperature of the measuring unit which is cooled by the fan, and a temperature control/power supply unit for supervising temperature information which is supplied from the temperature sensor and executing optimum control of the number of revolutions of the fan corresponding to a heating value of the measuring unit for every operating mode. The temperature control/power supply unit executes optimum control of the number of revolutions of the fan by controlling a voltage of the DC motor to obtain air-flow needed for cooling the measuring unit corresponding to the heating value.