The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2000
Filed:
Mar. 04, 1998
Steven Robert Emmert, Chandler, AZ (US);
Paul Robert Handly, Gilbert, AZ (US);
Erwin Perry Comer, Queen Creek, AZ (US);
Jason Jonathon Moore, Mesa, AZ (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
An single event upset (SEU) tolerant system for detecting and correcting an SEU includes a decision element (200) for receiving a plurality of outputs (120) from a plurality of signal generators (105) and producing an output (130) therefrom. The decision element includes voters which provide two levels of voting for the plurality of redundant outputs (120). First-level voters (300) provide intermediate voted outputs (315) which are received by a second-level voter to determine an output (130). An output disabler (400) determines when an output is provided external to the decision element. A plurality of comparators (210) receive intermediate voted outputs (315) from first-level voters and compare with a plurality of outputs from a plurality of signal generators to determine upset detected signals (125). An upset detected signal controls the selection of feedback for an element having experienced an SEU.