The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2000
Filed:
Feb. 13, 1995
David R Cok, Rochester, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A center of an approximately circular pattern in a physical image can be determined by scanning the physical image to produce an array of digital values. The array of digital values are used to calculate a score at each of a set of candidate center locations. The candidate center location having the highest score is selected as the best overall center for the entire pattern. Typically, the scores are computed on discrete rectangular grid locations, which gives the location of the center to the resolution of the discrete grid. The location can be determined to a finer resolution by recomputing the scores over a grid that has a finer resolution, but only extends over a small neighborhood around the first estimate of the center. This refinement can be repeated an arbitrary number of times. After the final refinement, the resulting estimate of the center location can be taken as the final estimate, or a final interpolation can be performed.