The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2000
Filed:
Jan. 21, 1998
Applicant:
Inventors:
Paul Melman, Newton, MA (US);
Marvin Tabasky, Peabody, MA (US);
Assignee:
NZ Applied Technologies, Woburn, MA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356246 ;
Abstract
A system for aligning the optical components of a chemical analysis system in which capillaries or optical fibers are supported by a micromachined substrate. The system provides for alignment of elements of an electrophoresis system in an efficient high sampling rate capability.