The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2000
Filed:
Nov. 26, 1997
Kenichi Suzuki, Fuji, JP;
Yukio Mizota, Numazu, JP;
Toshiba KiKai Kabushiki Kaisha, Tokyo-to, JP;
Abstract
A method of quality control of a die casting product, which method is capable of judging the quality in real time at a higher accuracy and updating and managing good quality product data for judging the higher quality thereof, includes a step of reading in measured data obtained as a result of a predetermined measurement with respect to the product cast by the die assembly in use together with the casting condition data, a step of sequentially accumulating the read measured data and casting condition data up to a predetermined capacity and performing a comparison display of the measured data combined with good quality product data to be used for judging a quality of the product, a step of repeating, if the comparatively displayed measured data are higher in quality than the present good quality product data, the above steps, then setting the accumulated measured data as a new good quality product data and updating the present good quality product data and the present casting condition data together with the above casting condition data, and a step of storing and holding the updated good quality product data and the updated casting condition data.