The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2000
Filed:
Oct. 15, 1998
Masaki Madenokouji, Saitama-ken, JP;
Keigo Onizuka, Gunma-ken, JP;
Isao Morita, Gunma-ken, JP;
Hisashi Tokizaki, Gunma-ken, JP;
Sanyo Electric Co., Ltd., Ohsaka-fu, JP;
Abstract
There is provided a calibration method of a detecting section which is provided on a substrate incorporated into a system interconnection generator and which detects by detecting means an object to be detected or an value of the object to be detected. The calibration method comprises the steps of prior to the substrate being incorporated into the system interconnection generator, measuring by the detecting section a reference value of the object to be detected by the detecting section; storing at least one of an error with respect to the reference value measured by the measuring step and the measured value of the reference value in association with the measurement result; and after the substrate being incorporated into the system interconnection generator, outputting the measurement result of the detecting section based on at least one of the error and the measured reference value, stored by the storing step in association with the measurement result.