The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2000
Filed:
Jan. 13, 1998
Thomas J Meitzler, Troy, MI (US);
Harpreet Singh, Detroit, MI (US);
The United States of America as represented by the Secretary of the Army, Washington, DC (US);
Abstract
A method to determine the probability of detection, P(t), of targets within infrared-imaged, pixelated scenes includes dividing the scenes into tar blocks and background blocks. A plurality of .DELTA.T metrics are applied to the blocked scenes to derive various .DELTA.T values for each scene. Factor analysis is then used on the various .DELTA.T values to derive a relative .DELTA.T for each scene. The scenes are divided again, into cells of pixels, in accordance with a plurality of clutter metrics. These clutter metrics are used to derive various clutter values for each scene. Factor analysis is used on the various clutter values to derive relative clutter values for each scene. The relative .DELTA.T values and the relative clutter values are used in determining the probabilities of detection of the targets in the scenes. Based on the probabilities of detection, the optimum scene or set of scenes is selected.