The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2000
Filed:
Nov. 06, 1998
Applicant:
Inventors:
Richard B Mazess, Madison, WI (US);
Joseph P Bisek, Madison, WI (US);
David L Ergun, Verona, WI (US);
Robert A Washenko, Madison, WI (US);
Assignee:
Lunar Corporation, Madison, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
378146 ; 378 9812 ; 378 54 ;
Abstract
A scanning densitometer provides transverse scanning of the patient with a small angle fan beam to significantly reduce parallax and image overlap blurring. Additional reduction of artifacts in the region of combined scans is obtained by a varying overlap of the scans when they are merged determined by a best matching of an identified structure within the scan. The matching process which reveals an ideal overlap provides height data of the structure allowing correction of magnification for structures which change in height within the patient over the scan.