The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2000
Filed:
Jan. 07, 1998
Applicant:
Inventor:
Shinzo Tsuboi, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G11B / ; G01R / ;
U.S. Cl.
CPC ...
360 25 ; 324212 ;
Abstract
In the recorded magnetization state measurement method of this invention, a recorded magnetization pattern formed on a medium is first detected by a magnetic force microscope (MFM). An MFM output signal extractor then extracts a one-dimensional MFM output signal along the direction of recording at a prescribed MFM reproduction width from the recorded magnetization pattern detected by the magnetic force microscope. A waveform value analyzer then calculates as output reproduction the average value of amplitude of the MFM output signal extracted by the MFM output signal extractor and calculates as medium noise the standard deviation of amplitude of the MFM output signal.