The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2000

Filed:

Dec. 01, 1998
Applicant:
Inventors:

Keiji Shioda, Tama, JP;

Masakazu Mizoguchi, Sagamikomachi, JP;

Junichi Nozawa, Hachioji, JP;

Takashi Fukaya, Sagamihara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
359372 ; 359369 ; 359630 ;
Abstract

A surgical microscope includes an illumination optical system for illuminating a microscope visual field, an observation optical system which has an eyepiece lens and an imaging lens and allows observation of a first image of an observation target by guiding reflected light from the observation target irradiated with illumination light to the eyepiece lens from the illumination optical system, an image projection optical system for projecting a second image as image information within a portion of the microscope visual field, and visual field adjusting mechanism which has a field stop placed at an imaging position of the imaging lens and having a changeable stop shape and adjusts an area of the microscope visual field by changing the stop shape of the field stop in accordance with a projection state of the second image with respect to the microscope visual field.


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