The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2000
Filed:
May. 20, 1997
Kenji Ebitani, Ebina, JP;
Yuzuru Suzuki, Ebina, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
An image processing system and method is presented which is capable of maintaining a high line count while preventing the generation of low-frequency periodic structures, using the supertiling method for image output devices such as printers. Threshold value matrix patterns are used for each supertile, and the input image data is compared with the threshold value. A dot pattern (binary image data) is generated based on the result of the comparison. Each supertile is divided up into a plurality (3.times.3) of halftone cells, and a dot pattern is generated for each halftone cell. A plurality of threshold value matrix patterns P1-P10 having identical shapes is used, and the pattern to be applied is selected randomly. This results in unevenness in the 'centers of gravity' of the dots in the halftone cells. Thus, no periodic structures appear.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile