The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2000

Filed:

Sep. 26, 1997
Applicant:
Inventors:

Dale A Messner, Uniontown, OH (US);

Ruhul Quddus, Cleveland Heights, OH (US);

John D Schellenberg, Cleveland Heights, OH (US);

Assignee:

Picker International, Inc., Highland Heights, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356375 ; 3562434 ; 359368 ; 25055929 ; 606130 ; 1286531 ;
Abstract

A microscope calibrator includes a housing supporting a series of focusing targets each situated at a predetermined distance from one another. Attributes of the microscope are determined by focusing the microscope on one ore more of the focusing targetrs and determining a location of the microscope with respect to the focusing targets focused upon. The position of the focusing targets are determinable by virtue of a local reference frame target attached to the microscope calibrator or by using a tracked probe to communicate the location of each point focused upon by the microscope on each of the focusing targets.


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