Testing unit for connector testing

Abstract

A testing unit is provided for mounting on a connector testing device for testing a connector which includes a plurality of metal terminals fastened to the connector by a lance system. A probe pin for testing conductivity is held by a molded resin slider having a pair of electrodes. The slider is integrally formed with a probe pin which holds a protrusion for testing, whether the fastening of the lance is complete. Positioning a lance testing member or protrusion relative to the lance can be achieved without providing a rotation-free stopper of the probe pin. In addition, individual failure testing can be achieved compared with the case which holds all of the probe pins. Furthermore, damage to the lance resulting from the material selection can also be avoided. Furthermore, a better connection between a probe pin and a lead wire is also provided when displacing probe pin of a connector testing device relative to the position of a lead wire. This is accomplished by providing a conductive member fixed to a block and connecting a lead wire with the fixed conductive member. Furthermore, the fixed conductive member and a probe pin are relatively and displaceably connected in an electrically conductive manner. The probe pin is retained in a relatively displaceable manner to the block by a slider. Thus, even when the probe pin is displaced relative to the block area during testing, a connecting position of the lead wire is not subjected to displacement from the predetermined position.