The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2000
Filed:
Apr. 01, 1998
Applicant:
Inventors:
Jouko Hautala, Tampere, FI;
Juhani Valli, Tampere, FI;
Timo Vuorinen, Tampere, FI;
Jorma Petajisto, Tampere, FI;
Assignee:
Valmet Corporation, Helsinki, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D21C / ;
U.S. Cl.
CPC ...
162 55 ; 162 61 ;
Abstract
A method and apparatus for controlling a multi-step screening apparatus (1) controls other accept, reject and dilution flows in relation to the flow measured in the accept channel (7a) of the first screening step (3a). Thus a simpler control unit (9) can be used and accept of higher quality can be obtained than before. The apparatus has a control unit (9) aranged to measure the flows of all accept, reject and dilution water channels (7a-7c, 5a, 5b, 11a, 11b) and to adjust the flow of the other channels on the basis of the flow of the accept channel of the first step.