The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2000

Filed:

Jan. 19, 1998
Applicant:
Inventors:

Dale R Greer, Novi, MI (US);

Munsang Kim, Seoul, KR;

Assignee:

Perceptron, Inc., Plymouth, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06G / ;
U.S. Cl.
CPC ...
700174 ; 96245 ; 96259 ; 96269 ;
Abstract

The non-contact sensor employs a structured light source that emits light in a predefined planar configuration and an optical receiver for reading reflected light produced by the structured light source within a predefined field of view. A tetrahedron target structure includes a three-dimensional framework that defines at least three non-collinear, non-coplanar structural lines each simultaneously visible to the sensor. A calibration system is coupled to the gauging system and the non-contact sensor for calibrating the gauging system by evaluating the geometric relationship of the structured light reflected from the structural lines of the target structure to determine the position and orientation of the target structure and then correlating the structural lines to the gauging system.


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