The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2000
Filed:
Nov. 09, 1998
Applicant:
Inventors:
Sandra Freedman Feldman, Niskayuna, NY (US);
Harsha Mysore Hatti, Schenectady, NY (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01J / ;
U.S. Cl.
CPC ...
356402 ; 250226 ; 356416 ; 356425 ;
Abstract
A patterned sample is analyzed by traversing a light spot across the sample and analyzing detected color at several sites to spatially resolve the pattern. A pattern analyzer includes a holder for supporting the sample which is illuminated by projecting the light spot onto the sample. A color sensor receives light reflected by the sample at the light spot and analyzes color of the sample at the spot. The spot is traversed across the sample surface to obtain a plurality of color readings across the surface to spatially resolve the pattern.