The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2000
Filed:
Aug. 18, 1999
Mark S Zetter, El Dorado Hills, CA (US);
Other;
Abstract
A method is presented to perform accurate property measurements using spectroscopic measurements at multiple wavelengths using nondispersed radiation with one, or sometimes two, detectors sensing all the requisite wavelengths simultaneously and calculating the value of the property by optical means. The heart of our invention is the utilization of an optical device opaque everywhere but at the finite and limited number of wavelengths where the transmittance measurements are being made, and whose transmittance at the measuring wavelengths is proportional to the coefficient for that wavelength in a predictive equation for the property value. The process which is our invention passes nondispersed light through a sample, with the transmitted light being led onto an optical device passing only the measuring wavelengths onto a detector. The optical device transmittances at the measuring wavelengths are proportional to the coefficients for those wavelengths, so that the total light passing through the optical device is actually proportional to the value of the property being measured. Our method leads to substantial reduction in instrument costs through simplified design and a reduction in components, with concomitant increased ease of use, and the elimination of the need for ancillary computational means.