The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2000
Filed:
Mar. 12, 1998
Kenji Yamamoto, Kanagawa, JP;
Hisanori Nasu, Kanagawa, JP;
Hitoshi Fujimiya, Kanagawa, JP;
Noriko Yurino, Kanagawa, JP;
Hitachi Software Engineering Co., Ltd., Kanagawa, JO;
Abstract
A method is disclosed which is capable of increasing a S/N ratio without subjecting a sample to any treatment to thereby detect hybridization with high sensitivity. A fragmentarily divided probe is used which is prepared by dividing a single probe 12 into a plurality of fragmentary probes 12a, 12b, and labeling the fragmentary probes with different fluorescent materials 14a, 14b, respectively. When the probe is hybridized with a sample 11, the fragmentary probes 12a,12b reconstitute the single probe. An intermittent light beam is used as excitation light 19. The fluorescent material 14a is excited therewith, and fluorescence 18 emitted from the fluorescent material 14b through multistep excitation is detected while irradiation with the excitation light is intermitted.