The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2000

Filed:

May. 22, 1998
Applicant:
Inventors:

Young-sun Kim, Kyungki-do, KR;

Sang-hyeop Lee, Seoul, KR;

Seung-hwan Lee, Seoul, KR;

Young-wook Park, Kyungki-do, KR;

Mikio Takagi, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05H / ; C23C / ;
U.S. Cl.
CPC ...
427578 ; 42725518 ; 4272557 ; 427 81 ; 438253 ; 438396 ;
Abstract

A method of forming a microelectronic device includes the step of forming an impurity doped amorphous silicon layer on a microelectronic substrate using plasma-enhanced chemical vapor deposition. The impurity doped amorphous silicon layer is patterned so that portions of the microelectronic substrate are exposed adjacent the patterned amorphous silicon layer. A hemispherical grained silicon layer is then formed on the patterned amorphous silicon layer. Moreover, the step of forming the impurity doped amorphous silicon layer can be performed at a temperature of 400.degree. C. or less.


Find Patent Forward Citations

Kim, Young-sun. (2000). Plasma enhanced chemical vapor deposition methods of forming (U.S. Patent No. 6077573). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6077573

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…