The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2000
Filed:
Apr. 27, 1999
Applicant:
Inventor:
Herbert M Stuttler, Rankweil, AT;
Assignee:
Leica Microsystems AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
351211 ; 359379 ;
Abstract
The invention concerns a microscope, in particular an operating microscope with a remote controlled adjustment system (32) for an ocular (8); the adjustment system preferably facilitates automatic adjustment of the ocular to match the optical characteristics of the user's eye (1). A further development also facilitates automatic adjustment of the separation of the eyepiece tubes in a stereomicroscope.